Software Tools For Molecular Microscopy/Utilities

Utilities

Website: http://coan.burnham.org/other-projects Contact: coan@burnham.org Two plugins for the Burnham-Brandeis Helical Package and/or Suprim, tkfilter for tomogram symmetry filtering and tkstraighten for boxing and straightening helical filaments. Support: Operating systems: Image format support: MRC Cost: Free for academic users Primary Publication to Cite: unpublished

Website: http://emlab.rose2.brandeis.edu/software Current version: 1.0 Contact: niko @brandeis.edu Program for cutting sections out of 2D and 3D density maps. Support: Operating systems: Linux/Mac Image format support: MRC Cost: Free/Open Source, GPL Primary Publication to Cite: unpublished

Website: http://emlab.rose2.brandeis.edu/software Current version: 1.12 Contact: niko @brandeis.edu Program to calculate difference maps between two density maps. Support: Operating systems: Linux/Mac Image format support: MRC Cost: Free/Open Source, GPL Primary Publication to Cite: unpublished

Website: http://www.imagescience.de/em2em.html Contact: em2em@ImageScience.de Program to convert images (2D images and 3D volumes) from/to formats typically used in the EM community. Support: Operating systems: Most platforms (Linux/Unix, Mac OS X (intel), MS Windows) Image format support: Most formats (IMAGIC, Spider, CCP4, MRC, CCP4, TIFF, etc.) Cost: Free Primary Publication to Cite: unpublished

Website: http://www.mathworks.com/matlabcentral/fileexchange/27021 Contact: Fred Sigworth Support: Operating systems: MATLAB-supported systems Image format support: Imagic, MRC and DM3 Cost: Free/Open Source, BSD license Written In: MATLAB Primary Publication to Cite: Unpublished

Website: http://cores.imp.ac.at/monitem Current version: 1.0.1 Contact: Guenter Resch <guenter.resch@imba.oeaw.ac.at> A software tool for the Tecnai and Titan platform of TEMs designed to increase system uptime by constant monitoring. Support: Operating systems: Windows Image format support: n/a Cost: Free Primary Publication to Cite: Brunner, M. J., and Resch, G. P. (2009): Automated monitoring to reduce electron microscope downtime. Ultramicroscopy 109, 1389-92.