Summary

• Figure Caption: Two examples of images from an ESEM. Taken with a Philips XL-30 FEG. The first shows an electron beam deposited nanowire between two microelectrodes that has burnt after sustaining a high bias current. The other shows a multiwall carbon nanotube sample. Shorter working distances often improve image quality and so does a low beam current but it also increases the image acquisition time.

• Thanks to Haldor Topsøe A/S for ESEM time.

• This illustration was made for the Opensource Handbook of Nanoscience and Nanotechnology

• Please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use this illustration!

• The image also appears on the Commons/nanotechnology page

• Illustration by Kristian Molhave

Licensing

This file is licensed under the Creative Commons Attribution 2.5 Generic license.

You are free:

• to share – to copy, distribute and transmit the work
• to remix – to adapt the work

Under the following conditions:

• attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.

https://creativecommons.org/licenses/by/2.5CC BY 2.5 Creative Commons Attribution 2.5 truetrue