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Summary
Overview of the main types of Scannig Probe Microscope types:
Scanning tunneling microscope (STM) - using the tunneling current I between the outermost atom of a conducting probe within an atomic distance from a substrate to map out the sample topography and electrical properties.
Atomic force microscope (AFM) - using the van der Waals forces or contact forces between a tip and the sample to measure the sample topography or mechanical properties.
Scanning near-field optical microscope (SNOM) - using the scattered light through a sub-wavelenght aperture to form an image.
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Overview of the main types of Scannig Probe Microscope types: *scanning tunneling microscope (STM) *Atomic force microscope (AFM) *Scanning Near-field Optical Microscope (SNOM) *Illustration by [http://kristian.molhave.dk Kristian Molhave] *Please acknow